Description
This high-end X-ray diffractometer is suitable for nanoscale characterisation of materials with short- and long-range order. A variable temperature stage allows for real-time assessment of structural rearrangements. The available rheo-cell allows for real-time assessment of (re)crystallisation under shear and under defined temperature conditions. This equipment is part of the equipment portfolio of Unilever made available for sharing through Shared Research Facilities.
Technical Details
- IµS microfocus X-ray source (CuKα radiation)
- Våntec 500 2D detector
- Rheo-SAXD (small angle x-ray diffraction)/WAXD (wide angle x-ray diffraction) cell
- Linkam stage for variable temperature measurements
Applications
- Crystal polymorphism (WAXD)
- Identification of crystalline phases (WAXD)
- Degree of crystallinity (WAXD)
- Quantification of crystalline components in mixtures (Rietveld analysis)
- Average crystallite thickness and crystallite thickness distributions (SAXD)
- Determination of orientation of crystalline phases (SAXD)
- In situ investigation of crystallization kinetics by Linkam temperature stage (SAXD/WAXD)
- Real-time SAXD/WAXD measurements under shear at variable temperature (rheo-SAXD/WAXD)