Description
X-ray diffraction is a versatile and non-destructive analysis method for the determination of material properties such as phase composition, structure and texture of powders, solids and liquids. Depending on the composition, X-ray radiation will be diffracted in a specific way in samples due to the regular distribution of atoms in a crystal. The diffraction pattern provides information about among others phase, crystal structure and crystal size.
Technical Details
| Brand |
Bruker |
| Goniometer |
D8 ADVANCE Theta/Theta |
| Measurement circle |
560mm |
| Tube |
2.2 kW Cu long fine focus |
| Tube Power |
40 kV / 40 mA |
| Primary optics |
Motorized divergence slits |
|
Soller slits |
|
Gobel Mirror |
| Sample stage |
Standard rotation stage with Motorized Air-Scatter Knife |
|
Anton Paar TTK600 temperature chamber UMC- stage |
|
Capillary stage; standard goniometer head |
| Secondary optics |
Soller slits |
| Detector |
LYNXEYE_XE_T, 3°opening |
Applications
- Identification of the crystal (by comparison with data from a database).
- Identification and characterisation of solid crystalline materials (including multi-phase mixtures).
- Determination of purity of crystals.
- Small Angle X-ray Scattering (SAXS): determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes, characteristic distances of partially ordered material.
- Wide Angle X-ray Diffraction (WAXD: the determination of the crystallinity of polymers such as polyesters, polyamides, and in cellulose and starch.
- Wide Angle X-ray Diffraction (WAXD): the determination of the size and phase of metal nanoparticles as well as the support materials in heterogeneous catalysts
- X-Ray Reflectometry (XRR): determination of layer thickness (0.1 nm-1000nm)
- Measuring XRD patterns at different temperatures
- Measuring XRD patterns in transmission mode with capillary sample holder.